[IEEE 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Raleigh, NC, USA (2005.11.6-2005.11.6)] 31st Annual Conference of IEEE Industrial Electronics Society, 2005. IECON 2005. - Local 3D map building and error analysis based on stereo vision
Huahua Chen, ; Zezhong Xu,
- 作者Huahua Chen, ; Zezhong Xu,
- 文件大小482.47KB
- 发表时间2005
- DOI10.1109/iecon.2005.1568934