[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Hybrid BIST Based on Repeating Sequences and Cluster Analysis
- 作者Lei Li, ; Chakrabarty, K.
- 文件大小190.29KB
- 发表时间2005
- DOI10.1109/date.2005.177
- 页码1142-1147
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