Si nanocrystal-containing SiOx (x < 2) produced by thermal annealing of PECVD realized thin films
M. Bedjaoui; B. Despax; M. Caumont; C. Bonafos
- 作者M. Bedjaoui; B. Despax; M. Caumont; C. Bonafos
- 印刷ISSN0921-5107
- 文件大小362.25KB
- 发表时间2005
- DOI10.1016/j.mseb.2005.08.066
- 页码508-512