SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 28 March 2005)] Terahertz for Military and Security Applications III - Sampled line reflectometers for terahertz s-parameter measurements
- 作者Weikle II, Robert M.; Liu, Zhiyang; Yang, Li; Ulker, Sadik; Lichtenberger, A. W.; Hwu, R. Jennifer; Woolard, Dwight L.; Rosker, Mark J.
- 卷第5790卷
- 印刷ISSN0277-786X
- 文件大小536.27KB
- 发表时间2005
- DOI10.1117/12.603395
- 页码137-148
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