Welding defect pattern recognition in TOFD signals Part 2. Non-linear classifiers
de Moura, E P; Siqueira, M H S; da Silva, R R; Rebello, J M A
- 期刊名称Insight - Non-Destructive Testing and Condition Monitoring
- 作者de Moura, E P; Siqueira, M H S; da Silva, R R; Rebello, J M A
- 卷第47卷
- 期第12期
- 印刷ISSN1354-2575
- 文件大小486.16KB
- 发表时间2005-12
- DOI10.1784/insi.2005.47.12.783
- 页码783-787