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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - <title>Application of Tatian

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SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Quality and System Performance II - Application of Tatian"s method to slanted-edge MTF measurement

Burns, Peter D.; Rasmussen, Rene; Miyake, Yoichi

作者Burns, Peter D.; Rasmussen, Rene; Miyake, Yoichi
卷第5668卷
印刷ISSN0277-786X
文件大小122.59KB
发表时间2005
DOI10.1117/12.597074
页码255-261

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