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[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Fast Transformation for DAC Parameters Identification

[IEEE 2005 IEEE Instrumentationand Measurement Technology - Ottawa, ON, Canada (16-19 May 2005)] 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings - Fast Transformation for DAC Parameters Identification

Angrisani, L.; D'Apuzzo, M.; D'Arco, M.

作者Angrisani, L.; D'Apuzzo, M.; D'Arco, M.
卷第1卷
文件大小173.17KB
发表时间2005
DOI10.1109/imtc.2005.1604211
页码714-719

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