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[IEEE 2005 IEEE Conference on Emerging Technologies and Factory Automation - Catania, Italy (19-22 Sept. 2005)] 2005 IEEE Conference on Emerging Technologies and Factory Automation - Quantitative Evaluation of the Safety of X-by-Wire Architecture subject to EMI Perturbations

[IEEE 2005 IEEE Conference on Emerging Technologies and Factory Automation - Catania, Italy (19-22 Sept. 2005)] 2005 IEEE Conference on Emerging Technologies and Factory Automation - Quantitative Evaluation of the Safety of X-by-Wire Architecture subject to EMI Perturbations

Wilwert, C.; Simonot-Lion, F.; YeQiong Song, ; Simonot, F.

作者Wilwert, C.; Simonot-Lion, F.; YeQiong Song, ; Simonot, F.
卷第1卷
文件大小5669.51KB
发表时间2005
DOI10.1109/etfa.2005.1612601
页码755-762

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