SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Two- and Three-Dimensional Methods for Inspection and Metrology III - Latest optical methods for industrial dimensional metrology
- 作者Harding, Kevin; Harding, Kevin G.
- 卷第6000卷
- 印刷ISSN0277-786X
- 文件大小112.91KB
- 发表时间2005
- DOI10.1117/12.631764
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