SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Improvement of Schmidt system
Hao, Peiming; Yang, Li; Wen, Shangming; Li, Hongguang; Pan, Baozhu; Chen, Yaolong; Kley, Ernst-Bernhard; Li, Weiwei; Yuan, Liyin; Mu, Renwang
- 作者Hao, Peiming; Yang, Li; Wen, Shangming; Li, Hongguang; Pan, Baozhu; Chen, Yaolong; Kley, Ernst-Bernhard; Li, Weiwei; Yuan, Liyin; Mu, Renwang
- 卷第6149卷
- 印刷ISSN0277-786X
- 文件大小290.30KB
- 发表时间2005
- DOI10.1117/12.674236