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SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - New method for inking-up on-line monitoring with ultrasonic sensor

SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - New method for inking-up on-line monitoring with ultrasonic sensor

Yang, Li; Lu, Jiwen; Zhang, Erhu; Wen, Shangming; Chen, Yaolong; Chen, Yajun; Kley, Ernst-Bernhard
  • 作者Yang, Li; Lu, Jiwen; Zhang, Erhu; Wen, Shangming; Chen, Yaolong; Chen, Yajun; Kley, Ernst-Bernhard
  • 卷第6149卷
  • 印刷ISSN0277-786X
  • 文件大小341.57KB
  • 发表时间2005
  • DOI10.1117/12.674303
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