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[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Functions for Quality Transition Fault Tests

[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Functions for Quality Transition Fault Tests

Michael, M.K.; Neophytou, S.; Tragoudas, S.
  • 作者Michael, M.K.; Neophytou, S.; Tragoudas, S.
  • 文件大小159.77KB
  • 发表时间2005
  • DOI10.1109/ISQED.2005.60
  • 页码327-332
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