[IEEE Sixth International Symposium on Quality of Electronic Design (ISQED'05) - San Jose, CA, USA (21-23 March 2005)] Sixth International Symposium on Quality of Electronic Design (ISQED'05) - Functions for Quality Transition Fault Tests
Michael, M.K.; Neophytou, S.; Tragoudas, S.
- 作者Michael, M.K.; Neophytou, S.; Tragoudas, S.
- 文件大小159.77KB
- 发表时间2005
- DOI10.1109/ISQED.2005.60
- 页码327-332