Maternal lineages and Alzheimer disease risk in the Old Order Amish

Joelle M. van der Walt; William K. Scott; Susan Slifer; P. C. Gaskell; Eden R. Martin; Kathleen Welsh-Bohmer; Marilyn Creason; Amy Crunk; Denise Fuzzell; Lynne McFarland; Charles C. Kroner; C. E. Jackson; Jonathan L. Haines; Margaret A. Pericak-Vance

作者Joelle M. van der Walt; William K. Scott; Susan Slifer; P. C. Gaskell; Eden R. Martin; Kathleen Welsh-Bohmer; Marilyn Creason; Amy Crunk; Denise Fuzzell; Lynne McFarland; Charles C. Kroner; C. E. Jackson; Jonathan L. Haines; Margaret A. Pericak-Vance
卷第118卷
期第1期
印刷ISSN0340-6717
电子ISSN1432-1203
文件大小308.14KB
发表时间2005-11
DOI10.1007/s00439-005-0032-x
页码115-122

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Maternal lineages and Alzheimer disease risk in the Old Order Amish