[IEEE 2006 IEEE International Conference on Semiconductor Electronics - Kuala Lumpur, Malaysia (2006.10.29-2006.12.1)] 2006 IEEE International Conference on Semiconductor Electronics - Analysis of Poly Resistor Mismatch
- 作者Tan, Philip Beow Yew; Kordesch, Albert Victor; Sidek, Othman
- 文件大小1038.22KB
- 发表时间2006
- DOI10.1109/smelec.2006.380795
- 页码1028-1029
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