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Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in cold-deformed aluminium bicrystals

Scanning electron microscopy and transmission electron microscopy in situ studies of grain boundary migration in cold-deformed aluminium bicrystals

H. PAUL; J. H. DRIVER; J. MORGIEL; A. LENS; A. BYDAŁEK; M. BIJAK

作者H. PAUL; J. H. DRIVER; J. MORGIEL; A. LENS; A. BYDAŁEK; M. BIJAK
卷第223卷
期第3期
文件大小127.57KB
发表时间2006
DOI10.1111/j.1365-2818.2006.01641.x
页码264-267

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