[IEEE 2006 International Workshop and Tutorials on Electron Devices and Materials. 7th Annual - Novosibirsk, Russia (2006.07.1-2006.07.5)] International Workshops and Tutorials on Electron Devices and Materials - The Method of Semiconductor Structure Impedance Measurement
- 作者Zayeev, Nikolay
- 文件大小1693.49KB
- 发表时间2006
- DOI10.1109/SIBEDM.2006.231661
- 页码315-318
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