![[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - 3-D simulation of geometrical variations impact on nanoscale FinFETs]()
[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - 3-D simulation of geometrical variations impact on nanoscale FinFETsShimeng Yu, ; Yuning Zhao, ; Yuncheng Song, ; Gang Du, ; Jinfeng Kang, ; Ruqi Han, ; Xiaoyan Liu, · 2008