Real Time Monitoring of the Deposition Mechanism in Chemical Solution Deposited PbSe Films Using Light Scattering
- 期刊名称Chemistry of Materials
- 作者Shandalov, M.; Golan, Y.
- 卷第18卷
- 期第16期
- 印刷ISSN0897-4756
- 电子ISSN1520-5002
- 文件大小266.45KB
- 发表时间2006-08
- DOI10.1021/cm061000m
- 页码3593-3595
同期刊推荐
Optical Nondestructive Evaluation for StructuresFu, Gongkang; Moosa, Adil G.; Peng, Juan · Research in Nondestructive Evaluation · 2001
Editorial NoteYolken, H. Thomas · Research in Nondestructive Evaluation · 1992
Editorial NoteYolken, H. Thomas · Research in Nondestructive Evaluation · 1990
Anomalous Magnetic Source Defect ModellingMa, B.; Atherton, D. L. · Research in Nondestructive Evaluation · 1995
Artificial LayerSolokhin, N. V.; Sumbatyan, M. A. · Research in Nondestructive Evaluation · 1994
Editorial Board EOVResearch in Nondestructive Evaluation · 2011
Focusing PVDF Transducers for Acoustic MicroscopySmolorz, S.; Grill, W. · Research in Nondestructive Evaluation · 1996
Editorial Board EOVResearch in Nondestructive Evaluation · 2015