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[IEEE Electrical Contacts - 2006. 52nd IEEE Holm Conference on Electrical Contacts - Montreal, QC, Canada (2006.09.25-2006.09.27)] Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts - Mechanism of ultra low force probing on Al electrodes

[IEEE Electrical Contacts - 2006. 52nd IEEE Holm Conference on Electrical Contacts - Montreal, QC, Canada (2006.09.25-2006.09.27)] Electrical Contacts - 2006. Proceedings of the 52nd IEEE Holm Conference on Electrical Contacts - Mechanism of ultra low force probing on Al electrodes

Kataoka, Kenichi; Itoh, Toshihiro; Suga, Tadatomo

作者Kataoka, Kenichi; Itoh, Toshihiro; Suga, Tadatomo
文件大小4822.51KB
发表时间2006
DOI10.1109/holm.2006.284059
页码21-25

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