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[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Laser optical in-circuit measurement system for immunity applications

[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Laser optical in-circuit measurement system for immunity applications

Chong Ding, ; Pommerenke, D.

作者Chong Ding, ; Pommerenke, D.
文件大小462.74KB
发表时间2006
DOI10.1109/isemc.2006.1706373
页码569-574

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