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[IEEE 2006 International Conference on Applied Electronics - Pilsen, Czech Republic (2006.09.6-2006.09.7)] 2006 International Conference on Applied Electronics - Study of influences on the changes of the surface tension

[IEEE 2006 International Conference on Applied Electronics - Pilsen, Czech Republic (2006.09.6-2006.09.7)] 2006 International Conference on Applied Electronics - Study of influences on the changes of the surface tension

Dusek, Karel; Urbanek, Jan

作者Dusek, Karel; Urbanek, Jan
文件大小3333.86KB
发表时间2006
DOI10.1109/ae.2006.4382959
页码39-42

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