Optical and crystallographic analysis of thin films of GeC deposited using a unique hollow cathode sputtering technique

J.L. Huguenin-Love; R.J. Soukup; N.J. Ianno; J.S. Schrader; D.W. Thompson; V.L. Dalal

作者J.L. Huguenin-Love; R.J. Soukup; N.J. Ianno; J.S. Schrader; D.W. Thompson; V.L. Dalal
卷第9卷
印刷ISSN1369-8001
文件大小243.22KB
发表时间2006
DOI10.1016/j.mssp.2006.08.026
页码759-763

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