Inductance probing into the semiconductor breakdown
- 期刊名称Applied Physics Letters
- 作者Lee, C. I.; Ngo, V. H.; Pan, D. S.
- 卷第89卷
- 期第17期
- 印刷ISSN0003-6951
- 文件大小491.43KB
- 发表时间2006
- DOI10.1063/1.2364838
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