[IEEE 2006 IEEE MTT-S International Microwave Symposium Digest - San Francisco, CA (2006.06.11-2006.06.16)] 2006 IEEE MTT-S International Microwave Symposium Digest - 3D analysis of ferroelectric thin-film planar microwave devices using Method of Line : application to the dynamic characterization of ferroelectric layers
Courreges, S.; Giraud, S.; Cros, D.; Madrangeas, V.; Aubourg, M.
- 作者Courreges, S.; Giraud, S.; Cros, D.; Madrangeas, V.; Aubourg, M.
- 文件大小3866.27KB
- 发表时间2006
- DOI10.1109/mwsym.2006.249921
- 页码1037-1040