Electrical characterization of defects introduced in n-type Ge during indium implantation

F. D. Auret; P. J. Janse Van Rensburg; M. Hayes; J. M. Nel; W. E. Meyer; S. Decoster; V. Matias; A. Vantomme

作者F. D. Auret; P. J. Janse Van Rensburg; M. Hayes; J. M. Nel; W. E. Meyer; S. Decoster; V. Matias; A. Vantomme
文件大小335.58KB
发表时间2006
DOI10.1063/1.2360922

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