[IEEE INTERMAG 2006 - IEEE International Magnetics Conference - San Diego, CA, USA (2006.05.8-2006.05.12)] INTERMAG 2006 - IEEE International Magnetics Conference - Crystallographic texture evolution during processing of hot dipped and diffusion annealed high silicon electrical steel
Ros-Yanez, T.; Barros, J.; Houbaert, Y.; Schneider, J.
- 作者Ros-Yanez, T.; Barros, J.; Houbaert, Y.; Schneider, J.
- 文件大小50.12KB
- 发表时间2006
- DOI10.1109/intmag.2006.374932
- 页码901-901