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[IEEE 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Bali, Indonesia (2006.06.26-2006.06.30)] 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Microstructure Simulation on Puncturing Phenomenon of ZnO Varistor under High Current

[IEEE 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Bali, Indonesia (2006.06.26-2006.06.30)] 2006 IEEE 8th International Conference on Properties and applications of Dielectric Materials - Microstructure Simulation on Puncturing Phenomenon of ZnO Varistor under High Current

He, Jinliang; Hu, Jun; Chen, Qingheng
  • 作者He, Jinliang; Hu, Jun; Chen, Qingheng
  • 文件大小4459.93KB
  • 发表时间2006
  • DOI10.1109/icpadm.2006.284337
  • 页码959-962
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