Characterization of Electrical Properties of Si Nanocrystals Embedded in an Insulating Layer by Scanning Probe Microscopy

Kim, Jung Min; Her, Hyun Jung; Son, Jeong Min; Khang, Y.; Lee, Eun Hye; Kim, Yong Sang; Choi, Y.J.; Kang, C.J.

期刊名称Materials Science Forum
作者Kim, Jung Min; Her, Hyun Jung; Son, Jeong Min; Khang, Y.; Lee, Eun Hye; Kim, Yong Sang; Choi, Y.J.; Kang, C.J.
电子ISSN1662-9752
文件大小644.63KB
发表时间2006
DOI10.4028/www.scientific.net/MSF.510-511.1094
页码1094-1097

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