Hot carrier reliability of RF N- LDMOS for S Band radar application

M. Gares; H. Maanane; M. Masmoudi; P. Bertram; J. Marcon; M.A. Belaid; K. Mourgues; C. Tolant; P. Eudeline

作者M. Gares; H. Maanane; M. Masmoudi; P. Bertram; J. Marcon; M.A. Belaid; K. Mourgues; C. Tolant; P. Eudeline
卷第46卷
印刷ISSN0026-2714
文件大小489.45KB
发表时间2006
DOI10.1016/j.microrel.2006.07.074
页码1806-1811

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