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Characterization of hot-carrier degraded SiGe/Si-hetero-PMOSFETs

Characterization of hot-carrier degraded SiGe/Si-hetero-PMOSFETs

Toshiaki Tsuchiya; Masao Sakuraba; Junichi Murota

作者Toshiaki Tsuchiya; Masao Sakuraba; Junichi Murota
卷第508卷
印刷ISSN0040-6090
文件大小183.04KB
发表时间2006
DOI10.1016/j.tsf.2005.07.320
页码326-328

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