Single cylinder in situ scanning electron microscope fatigue system
Smiltneek, Larry; Shinde, Sachin R.; Hoeppner, David W.
- 期刊名称Review of Scientific Instruments
- 作者Smiltneek, Larry; Shinde, Sachin R.; Hoeppner, David W.
- 卷第77卷
- 期第1期
- 印刷ISSN0034-6748
- 文件大小423.81KB
- 发表时间2006
- DOI10.1063/1.2163809