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[AIP BEAM INSTRUMENTATION WORKSHOP 2006: Twelfth Beam Instrumentation Workshop - Batavia, Illinois (USA) (1-4 May 2006)] AIP Conference Proceedings - Wide Dynamic Range Front-end Electronics for Beam Current and Position Measurement

[AIP BEAM INSTRUMENTATION WORKSHOP 2006: Twelfth Beam Instrumentation Workshop - Batavia, Illinois (USA) (1-4 May 2006)] AIP Conference Proceedings - Wide Dynamic Range Front-end Electronics for Beam Current and Position Measurement

Rawnsley, W. R.; Potter, R. J.; Verzilov, V. A.; Root, L.

作者Rawnsley, W. R.; Potter, R. J.; Verzilov, V. A.; Root, L.
卷第868卷
文件大小465.44KB
发表时间2006
DOI10.1063/1.2401435
页码454-462

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