发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - A SW performance estimation framework for early system-level-design using fine-grained instrumentation

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - A SW performance estimation framework for early system-level-design using fine-grained instrumentation

Kempf, T.; Karuri, K.; Wallentowitz, S.; Ascheid, G.; Leupers, R.; Meyr, H.

作者Kempf, T.; Karuri, K.; Wallentowitz, S.; Ascheid, G.; Leupers, R.; Meyr, H.
文件大小1541.98KB
发表时间2006
DOI10.1109/DATE.2006.243830

← 返回【学霸图书馆】主页