The reliability of general vague fault-tree analysis on weapon systems fault diagnosis
J.-R. Chang; K.-H. Chang; S.-H. Liao; C.-H. Cheng
- 作者J.-R. Chang; K.-H. Chang; S.-H. Liao; C.-H. Cheng
- 卷第10卷
- 期第7期
- 印刷ISSN1432-7643
- 电子ISSN1433-7479
- 文件大小247.61KB
- 发表时间2006-05
- DOI10.1007/s00500-005-0483-y
- 页码531-542