Defects with bright contrast in the induced-current mode in GaN-based light-emitting structures

• 作者S. A. Bel’nik; P. S. Vergeles; N. M. Shmidt; E. B. Yakimov
• 卷第1卷
• 期第4期
• 印刷ISSN1027-4510
• 电子ISSN1819-7094
• 文件大小212.28KB
• 发表时间2007-08
• DOI10.1134/s1027451007040052
• 页码394-397