Mapping of Single Event Burnout in Power MOSFETs
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Haran, Avner; Barak, Joseph; David, David; Refaeli, Nati; Fischer, Bernd E.; Voss, Kay-Obbe; Du, Guanghua; Heiss, Markus
- 卷第54卷
- 期第6期
- 印刷ISSN0018-9499
- 文件大小574.62KB
- 发表时间2007-12
- DOI10.1109/TNS.2007.910851
- 页码2488-2494
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