$Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy$

Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy

Lee, Hyo-Jong; Ha, Jun-Seok; Lee, S. W.; Lee, H. J.; Goto, H.; Lee, S. H.; Cho, M. W.; Yao, T.; Minegishi, T.; Hanada, T.; Hong, Soon-Ku; Sakata, Osami; Lee, Jae Wook; Lee, Jeong Yong

期刊名称Applied Physics Letters
作者Lee, Hyo-Jong; Ha, Jun-Seok; Lee, S. W.; Lee, H. J.; Goto, H.; Lee, S. H.; Cho, M. W.; Yao, T.; Minegishi, T.; Hanada, T.; Hong, Soon-Ku; Sakata, Osami; Lee, Jae Wook; Lee, Jeong Yong
卷第91卷
期第20期
印刷ISSN0003-6951
文件大小661.05KB
发表时间2007
DOI10.1063/1.2815919

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Structural investigation of nitrided c-sapphire substrate by grazing incidence x-ray diffraction and transmission electron microscopy