Effect of growth orientation and surface roughness on electron transport in silicon nanowires
- 期刊名称Physical Review B
- 作者Svizhenko, Alexei; Leu, Paul W.; Cho, Kyeongjae
- 卷第75卷
- 期第12期
- 印刷ISSN1098-0121
- 电子ISSN1550-235X
- 文件大小872.30KB
- 发表时间2007-3-14
- DOI10.1103/PhysRevB.75.125417
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