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[IEEE 2007 9th Electronics Packaging Technology Conference - Singapore (2007.12.10-2007.12.12)] 2007 9th Electronics Packaging Technology Conference - Analysis of the Effect of AC Noise on DC Bias of VGA for UHF RFID using Chip-package Co-modeling and Simulation

[IEEE 2007 9th Electronics Packaging Technology Conference - Singapore (2007.12.10-2007.12.12)] 2007 9th Electronics Packaging Technology Conference - Analysis of the Effect of AC Noise on DC Bias of VGA for UHF RFID using Chip-package Co-modeling and Simulation

Lee, Hyein; Shim, Yujeong; Park, Hyungjeong; Ryu, Chunghyun; Yoon, Changwook; Kim, Joungho
  • 作者Lee, Hyein; Shim, Yujeong; Park, Hyungjeong; Ryu, Chunghyun; Yoon, Changwook; Kim, Joungho
  • 文件大小4998.43KB
  • 发表时间2007
  • DOI10.1109/eptc.2007.4469739
  • 页码591-594
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