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[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Design of High-Resolution MOSFET-Only Pipelined ADCs with Digital Calibration

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Design of High-Resolution MOSFET-Only Pipelined ADCs with Digital Calibration

Aminzadeh, Hamed; Danaie, Mohammad; Lotfi, Reza

作者Aminzadeh, Hamed; Danaie, Mohammad; Lotfi, Reza
文件大小376.54KB
发表时间2007
DOI10.1109/date.2007.364629
页码1-6

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