[IEEE 2007 IEEE International SOI Conference - Indian Wells, CA, USA (2007.10.1-2007.10.4)] 2007 IEEE International SOI Conference - Experimental Hardware Calibrated Compact Models for 50nm n-channel FinFETs

• 作者Song, Jooyoung; Yu, Bo; Xiong, W.; Hsu, C.H.; Cleavelin, C.R.; Ma, M.; Patruno, P.; Taur, Yuan
• 文件大小553.37KB
• 发表时间2007
• DOI10.1109/SOI.2007.4357887
• 页码131-132