[IEEE ESSDERC 2007 - 37th European Solid State Device Research Conference - Muenchen, Germany (2007.09.11-2007.09.13)] ESSDERC 2007 - 37th European Solid State Device Research Conference - Mobility issues in double-gate SOI MOSFETs: Characterization and analysis
- 作者Rodriguez, N.; Cristoloveanu, S.; Nguyen, L. Pham; Gamiz, F.
- 文件大小257.40KB
- 发表时间2007
- DOI10.1109/essderc.2007.4430930
- 页码271-274
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