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Experimental Study on Breakdown of Mobility Universality in <formula formulatype=

$langle 100rangle$-Directed (110)-Oriented pMOSFETs" onerror="this.onerror=null;window.coverFallback&&coverFallback(this);">

Experimental Study on Breakdown of Mobility Universality in $langle 100rangle$-Directed (110)-Oriented pMOSFETs

Shimizu, Ken; Tsutsui, Gen; Januar, Doni; Saraya, Takuya; Hiramoto, Toshiro

期刊名称IEEE Transactions On Nanotechnology
作者Shimizu, Ken; Tsutsui, Gen; Januar, Doni; Saraya, Takuya; Hiramoto, Toshiro
卷第6卷
期第3期
印刷ISSN1536-125X
文件大小737.15KB
发表时间2007-05
DOI10.1109/tnano.2007.894556
页码358-361

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