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[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - An auto-Sensitivity Control Circuit Using Analog Topology for Wired CDMA Bus Interface

[IEEE 2007 2nd International Design and Test Workshop - Cairo, Egypt (2007.12.16-2007.12.18)] 2007 2nd International Design and Test Workshop - An auto-Sensitivity Control Circuit Using Analog Topology for Wired CDMA Bus Interface

Eltokhy, Mostafa Aly Refay; Mansour, H. A. K.; Abd-Elhameed, M. E.
  • 作者Eltokhy, Mostafa Aly Refay; Mansour, H. A. K.; Abd-Elhameed, M. E.
  • 文件大小3660.21KB
  • 发表时间2007
  • DOI10.1109/idt.2007.4437458
  • 页码193-197
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