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Time of flight secondary ion mass spectrometry: A powerful high throughput screening tool

Time of flight secondary ion mass spectrometry: A powerful high throughput screening tool

Smentkowski, Vincent S.; Ostrowski, Sara G.
  • 期刊名称Review of Scientific Instruments
  • 作者Smentkowski, Vincent S.; Ostrowski, Sara G.
  • 卷第78卷
  • 期第7期
  • 印刷ISSN0034-6748
  • 文件大小819.99KB
  • 发表时间2007
  • DOI10.1063/1.2755693
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