Time of flight secondary ion mass spectrometry: A powerful high throughput screening tool
Smentkowski, Vincent S.; Ostrowski, Sara G.
- 期刊名称Review of Scientific Instruments
- 作者Smentkowski, Vincent S.; Ostrowski, Sara G.
- 卷第78卷
- 期第7期
- 印刷ISSN0034-6748
- 文件大小819.99KB
- 发表时间2007
- DOI10.1063/1.2755693