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[IEEE 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference - Munich, Germany (2007.06.17-2007.06.22)] 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference - Analysis of errors in an optical Controlled-NOT gate with a high-precision testing bed

[IEEE 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference - Munich, Germany (2007.06.17-2007.06.22)] 2007 European Conference on Lasers and Electro-Optics and the International Quantum Electronics Conference - Analysis of errors in an optical Controlled-NOT gate with a high-precision testing bed

Nagata, Tomohisa; Okamoto, Ryo; Hofmann, Holger F.; Takeuchi, Shigeki; Sasaki, Keiji

作者Nagata, Tomohisa; Okamoto, Ryo; Hofmann, Holger F.; Takeuchi, Shigeki; Sasaki, Keiji
文件大小124.11KB
发表时间2007
DOI10.1109/cleoe-iqec.2007.4386920
页码1-1

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