[IEEE 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Rabat, Morocco (2007.09.2-2007.09.5)] 2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Minimization of functional tests by statistical modelling of analogue circuits
Akkouche, Nourredine; Bounceur, Ahcene; Mir, Salvador; Simeu, Emmanuel
- 作者Akkouche, Nourredine; Bounceur, Ahcene; Mir, Salvador; Simeu, Emmanuel
- 文件大小419.01KB
- 发表时间2007
- DOI10.1109/dtis.2007.4449488
- 页码35-40