[IEEE 2007 8th International Conference on Electronic Measurement and Instruments - Xian, China (2007.08.16-2007.07.18)] 2007 8th International Conference on Electronic Measurement and Instruments - A New Method for Conducted EMI Noise Diagnosis
Kelin, Jia; Jingmei, Wang; Chang, Wu; Chuang, Bi
- 作者Kelin, Jia; Jingmei, Wang; Chang, Wu; Chuang, Bi
- 文件大小864.73KB
- 发表时间2007
- DOI10.1109/icemi.2007.4351212