Morphological stability of electromigration-driven vacancy islands
- 期刊名称Physical Review E
- 作者Haußer, Frank; Kuhn, Philipp; Krug, Joachim; Voigt, Axel
- 卷第75卷
- 期第4期
- 印刷ISSN1539-3755
- 电子ISSN1550-2376
- 文件大小452.28KB
- 发表时间2007-4-20
- DOI10.1103/physreve.75.046210
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