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[IEEE 2007 International Symposium on VLSI Design, Automation and Test - Hsinchu, Taiwan (2007.04.25-2007.04.27)] 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Low Cost Testing of Quadruple Band GSM RFCMOS SOC

[IEEE 2007 International Symposium on VLSI Design, Automation and Test - Hsinchu, Taiwan (2007.04.25-2007.04.27)] 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Low Cost Testing of Quadruple Band GSM RFCMOS SOC

Lai, Bobby; Rivera, Chris; Waheed, Khurram

作者Lai, Bobby; Rivera, Chris; Waheed, Khurram
文件大小4083.01KB
发表时间2007
DOI10.1109/vdat.2007.373217
页码1-4

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